COMP 445 - Image Analysis and Pattern Recognition (Cross-listed as PHYS 445, MATH 445)

Units: 3
Three hours lecture in the lab per week
Prerequisite(s): PHYS 345 /COMP 345 /MATH 345 or Consent of Instructor
Addresses the issue of analyzing the pattern content within an image. Pattern recognition consists of image segmentation, feature extraction, and classification. The principles and concepts underpinning pattern recognition, and the evolution, utility, and limitations of various techniques (including neural networks) will be studied. Programming exercises will be used to implement examples and applications of pattern recognition processes, and their performance on a variety of diverse synthetic and real images will be studied.
Same as: PHYS 445 , MATH 445